Advanced Microscopy Inc. v. Nikon Instruments, Inc.
1:15-cv-00518
Overview
Case Number
1:15-cv-00518
Filing Date
2015-06-19
Status
Terminated
Termination Date
2015-09-11
Court
District Court, D. Delaware (ded)
Presiding Judge
Leonard P. Stark
Nature of Suit
830 Patent
Jurisdiction Type
Federal Question
Cause of Action
35:271 Patent Infringement
Jury Demand
Plaintiff
Parties
Defendant
Nikon Instruments, Inc.
Represented By
3 Attorneys ListedMorgan Lewis & Bockius LLP
Tel: +1 (302) 574-3000
Fax: +1 (302) 574-3001
1007 Orange Street, Suite 501
Plaintiff
Advanced Microscopy Inc.
Represented By
5 Attorneys ListedFarnan LLP
Tel: +1 (302) 777-0338
Fax: +1 (302) 421-5870
919 North Market Street, 12th Floor
Farnan LLP
Tel: +1 (302) 777-0300
Fax: +1 (302) 777-0301
919 North Market Street, 12th Floor
Court & Judges
Court
District Court, D. Delaware (ded)
Presiding Judge
Leonard P. Stark
Patents Involved
No asserted patent numbers detected in initial docket filings yet.
Docket Entries
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