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ILLUMINATION FILTER SYSTEM AND OBSERVATION SYSTEM FOR A MULTISPECTRAL FLUORESCENCE MICROSCOPE, MULTISPECTRAL FLUORESCENCE MICROSCOPE, AND MICROSCOPYING METHOD

Publication No. EP3940436
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App No. EP21184184
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Filed by Leica Instruments (Singapore) Pte. Ltd.
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Filed on 2016-02-15
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Issued/Published on 2025-12-17
Publication No. EP3940436 A1
Application No. EP21184184 Filed: 2016-02-15
Grant Date 2025-12-17 Mention of grant
Active Oppositions 2 Active EPO Oppositions

Patent Abstract / Summary

[0001] The present invention relates to an observation system (3) for medical imaging, in particular multispectral fluorescence imaging, as performed e.g. in a microscope (1) or endoscope, in particular a multispectral fluorescence microscope, comprising a beam splitter (21) adapted to split a light image (13) into a first light portion (16, 17) along a first light path (18) and a second light portion (20) along a second light path (19). To improve known observation systems, so these systems work with one light source only, are capable of capturing simultaneously at least one fluorescence signal and a signal of visible reflected light and allow a homogeneous illumination for obtaining different images from the object illuminated, the first light portion (16, 17) comprises at least two fluorescence emission band (Em.1, Em.2), wherein the first emission band (Em.1) in the visible spectrum, and wherein the second light portion (20) comprises a visible reflected light (VISR), and the observation system (3) further comprises a first sensor (23) for capturing the at least two fluorescence emission bands (Em.1, Em.2) of the first light portion (16, 17), and a second sensor (24) for capturing the visible reflected light of the second light portion (20).

IPC Classifications

G02B5/28, A61B1/04, G01N21/64, G02B21/16

Priority Claims

No priority claims recorded

Designated Contracting States (38 EPC States)

AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

Parties & Representation

Applicants

Leica Instruments (Singapore) Pte. Ltd.

12 Teban Gardens Crescent, Singapore 608924

SG

Inventors (2)

Kuster, Manfred

9443 Widnau

CH

Themelis, George

88131 Lindau

DE

Representatives / Agents

Grünecker Patent- und Rechtsanwälte PartG mbB

Leopoldstraße 4, 80802 München

DE

Diehl & Partner

Patent- und Rechtsanwaltskanzlei mbB, Erika-Mann-Straße 9

DE

Weickert, Jonas

Thum & Partner, Thum Mötsch Weickert

DE

Key Procedural Dates

Request-For-Examination 2022-06-01
Mention Of Grant Published 2025-12-17
First-Examination-Report-Despatched 2023-09-20