Samsung Electronics Co., Ltd. et al. vs. Daedalus Prime LLC

Explore the PTAB proceeding IPR2023-00653 filed by Samsung Electronics Co., Ltd. et al. on 2023-03-06. This includes filing dates, application numbers, tech centers, patent numbers, and current case status.

Proceeding Overview

Proceeding Number

IPR2023-00653

Filing Date

2023-03-06

Accorded Filing Date

2023-03-06

Institution Decision Date

—

Last Modified Date

—

Proceeding Type

IPR

Termination Date

2023-06-28

Trial Status

Terminated-Settled

Parties & Counsel

Petitioner

Samsung Electronics Co., Ltd. et al.

Represented By

Renner, W. Karlet al

Patent Owner / Respondent

Daedalus Prime LLC

Represented By

Meunier, Williamet al

Tribunal & Venue

Tribunal

Patent Trial and Appeal Board (USPTO)

Technology Center

TC 2800 - Semiconductors, Electrical & Optical Systems

Patent Information

1 Patent Involved

Respondent Application Number 16881541

Respondent Patent Number 11251281

External Links

Espacenet

Google Patents

Respondent Inventor Glenn A. GLASS et al

Respondent Tech Center TC 2800 - Semiconductors, Electrical & Optical Systems

Address and Attorney/Agent Information

4 Registered Practitioners

Power of Attorney & Correspondence

Firm / Entity Name McClure, Qualey & Rodack, LLP

Customer Number 109673

Address 280 Interstate North Circle SE, Suite 530, Atlanta, GA, 30339, UNITED STATES

Attorney / Agent Information

Reg #	Name	Phone
38962	Daniel Mcclure	678-483-8899
43024	Michael Qualey	678-483-8899
47034	David Rodack	678-483-8899
63063	Jeffrey Hsu	678-483-8899

Proceeding Documents

Notice: refund approved NOTICE

2023-07-14 FILING PARTY: BOARD

Download

Petitioner's Request for Refund OTHER

2023-07-11 FILING PARTY: PETITIONER

Download

Termination Decision: Settlement Prior to Institution of Trial 37 C.F.R. sec. 42.74 TERMINATE

2023-06-28 FILING PARTY: BOARD

Download

Joint Motion to Terminate MOTION

2023-06-13 FILING PARTY: PETITIONER

Download

Joint Request to Keep Settlement Agreement Confidential OTHER

2023-06-13 FILING PARTY: PETITIONER

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Samsung Electronics Co., Ltd. et al. vs. Daedalus Prime LLC

Proceeding Overview

Parties & Counsel

Petitioner

Samsung Electronics Co., Ltd. et al.

Represented By

Patent Owner / Respondent

Daedalus Prime LLC

Represented By

Tribunal & Venue

Patent Information

Address and Attorney/Agent Information

Power of Attorney & Correspondence

Attorney / Agent Information

Proceeding Documents

Notice: refund approved NOTICE

Petitioner's Request for Refund OTHER

Termination Decision: Settlement Prior to Institution of Trial 37 C.F.R. sec. 42.74 TERMINATE

Joint Motion to Terminate MOTION

Joint Request to Keep Settlement Agreement Confidential OTHER

Exhibit 3001 Exhibit

Order: Conduct of the Proceeding ORDER

Notice: Notice filing date accorded NOTICE

Notice : Power of Attorney NOTICE

Notice : Mandatory Notice NOTICE

Mirabella Mechanisms of Boron Diffusion in Silicon and Germanium Exhibit

U.S. Patent App. Pub. No. 20100276761 Tung Exhibit

Shearer, Power Management in Mobile Devices Exhibit

Daedalus Prime LLCs Complaint In the Matter of Certain Semiconductor Device Exhibit

Larsen Epitaxial Growth of Ge and SiGe on Si Substrates Exhibit

Elsevier, Encyclopedia of Materials Exhibit

Declaration of E. Fred Schubert Exhibit

U.S. Application Serial No. 13990224 Exhibit

U.S. Patent No. 11,251,281 to Glass Exhibit

U.S. Patent App. Pub. No. 20110147842 Cappellani Exhibit

Exhibit 47 to Complaint Exhibit

Caputa, Efficient High Speed On-Chip Global Interconnects Exhibit

Certified English Translation of Japanese Publication No 2010-171337 Tezuka Exhibit

Order Granting Stay Exhibit

Kim Increased Critical Thickness for High Ge-Content Strained SiGe-on-Si Exhibit

U.S. Patent App. Pub. No. 20110042748 Anderson Exhibit

Exhibit 48 to Complaint Exhibit

U.S. Patent No. 7,692,254 Anderson Exhibit

U.S. Patent App. Pub. No. 20110073952 Kwok Exhibit

Excerpts of the File History of EP Patent App. No. 19188924.5 Exhibit

Zhao, All About Interconnects Exhibit

Petitioner's Power of Attorney NOTICE

Schubert Room Temperature Properties of Si, Ge, GaAs, and GaN Exhibit

U.S. Patent App. Pub. No. 20070082451 Samoilov Exhibit

U.S. Patent App. Pub. No. 20090325350 Radosavljevic Exhibit

EP Application No. 1 575 082 A2 Demeurisse Exhibit

Semiconductor Doping Technology Exhibit

U.S. Patent App. Pub. No. 20100123198 Kim Exhibit

Stavitski, Silicide toSilicon Specific Contact Resistance Characterization Exhibit

U.S. Patent App. Pub. No. 20090325607 Conway Exhibit

U.S. Patent App. Pub. No. 20110024804 Chang Exhibit

U.S. Application Serial No. 12975278 Exhibit

Japanese Patent Application Publication No. 2010-171337 Exhibit

Complaint, Daedalus Prime LLC v. Samsung Electronics Co. Ltd. et al Exhibit

U.S. Patent App. Pub. No. 5,439,848 Hsu Exhibit

U.S. Patent No. 5,296,386 Aronowitz Exhibit

U.S. Patent No. 20070235802 Chong Exhibit

Excerpts of the File History of the 281 Patent Exhibit

Brown Lattice stability and point defect energetics of TiSi2 and TiGe2 Exhibit

Director Vidals Memorandum re Interim Procedure for Discretionary Denials Exhibit

U.S. Patent App. Pub. No. 20050184316 Kim Exhibit

U.S. Patent App. Pub. No. 20060071275 Brask Exhibit

U.S. Patent No. 7,288,443 Zhu Exhibit

Petition for Inter Partes Review PETITION

Nishida Elimination of Misfit Dislocations in Si1-xGex/Si Heterostructures Exhibit

U.S. Patent App. Pub. No. 20120139015 Yu Exhibit

U.S. Patent App. Pub. No. 20060286755 Brask Exhibit

U.S. Patent App. Pub. No. 20100148217 Simonelli Exhibit

Hadley, Semiconductor Doping, Institute of Solid State Physics Exhibit

Fitzgerald,The Effect of Substrate Growth Area on Misfit and Threading Exhibit